Colloquium
Department of Physics, NCU
Local optical mapping of photonic devices and materials
Speaker
Prof. Aurelien Bruyant
Laboratory of Nanotechnology, Instrumentation and Optics
University of Technology of Troyes, France
Date 2016.11.29(Tue)
Time 14:00
Place S4-625
Scanning near-field optical microscopy is a unique tool to optically characterize devices and material at the nanoscale. During the last decade, we have developed several phase-sensitive approaches in order to fully exploit the potential of this technique, notably for:
(1) analyzing the light propagation in integrated optical device (modal approach)
(2) perform local spectroscopic analysis.
In this presentation, we will details the basics of the methods with an emphasis on the application as well as recent instrumental advances.