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研究著作 : |
(A)期刊論文:
1. M.F. Luo*, Y.H. Su, G.R. Hu, C.-H. Nien, Y.W. Hsueh, and Peilong Chen,
(2009/1) “Dynamic behaviour of a nanoscale-patterned phospholipid thin
film on mica and silicon studied by atomic force microscopy”, Thin Solid
Films 517, pp.1765-1769.
2. J. Y. Chen, G. C. Chi, P. J. Huang, M. Y. Chen, S. C. Hung, C. H. Nien,
M. C. Chen, S. M. Lan, B. J. Pong, C. J. Pan, C. J. Tun, F. Ren, C. Y.
Chang, and S. J. Pearton1*, (2008/4) “Microstructure of InN quantum dots
grown on AlN buffer layers by metal organic vapor phase epitaxy”, Appl.
Phys. Lett. 92, p. 162103.
3. Wen-Bin Jian*, I-Jan Chen, Tai-Chin Liao, Yi-Ching Ou, Cheng-Hsun Nien,
Zhong-Yi Wu, Fu-Rong Chen, Ji-Jung Kai, and Juhn-Jong Lin, (2008/1) “Size
Dependent Magnetization and High-Vacuum Annealing Enhanced Ferromagnetism
in Zn1-xCoxO Nanowires”, J. Nanosci. Nanotechnol. 8, 202–211.
4. Yu-Wen Liao, L. H. Chen, K. C. Kao, C.-H. Nien, Minn-Tsong Lin, and
Ker-Jar Song*, (2007/3) “Faceting and defaceting phase transitions of
Pd/W”, Phys. Rev. B 75, pp.125428_1-11.
5. C.-H. Nien*, C. H. Tsai, K. Y. Shin, and W. B. Jian, (2006/10) “Methods
of determining the contact between a probe and a surface under scanning
electron microscopy”, Rev. Sci. Instru 77, p. 103709.
6. M. F. Luo*, Y. L. Yeh, P. L. Chen, C.-H. Nien, and Y. W. Hsueh*,
(2006/5) “An atomic force microscope study of thermal behavior of
phospholipids monolayers on mica”, J. Chem. Phys. 124, p.194702.
7. Andrzej Szczepkowicz*, Antoni Ciszewski, Robert Bryl, Czeshaw Oleksy,
Cheng-Hsun Nien, Qifei Wu, Theodore E. Madey, (2005/10) “A comparison of
adsorbate-induced faceting on flat and curved crystal surfaces”, Surf.
Sci.599, pp.55-68.
(B) 專利:
1. 粘正勳*、蔡春鴻、辛坤瑩、簡紋濱,「電子顯微鏡、探針接觸點及其接觸的測定方法」,中華民國專利:發明 I 311328,專利權期間:2009.
6. 21 – 2026. 5 10 (中央大學)。
2. Cheng-Hsun Nien*, Chuen-Horng Tsai, Kun-Ying. Shin, and Wen-Bin Jian,
“Electron Microscope, Methods to Determine the Contact Point and the
Contact of the Probe”, US 7435954 B2 (Oct. 14, 2008) (sponsored by
National Central University).
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